The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Feb. 03, 2014
Applicant:
Renishaw Plc, Wotton-under-Edge, Gloucestershire, GB;
Inventor:
John Ould, Backwell, GB;
Assignee:
RENISHAW PLC, Wotton-under-Edge, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/04 (2006.01); G01B 5/10 (2006.01); G01B 5/20 (2006.01); G01B 5/213 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G01B 21/04 (2013.01); G01B 5/10 (2013.01); G01B 5/201 (2013.01); G01B 5/213 (2013.01); G05B 19/401 (2013.01); G05B 2219/37043 (2013.01);
Abstract
A method and apparatus for measuring a part with a contact probe mounted on a coordinate positioning machine. The method includes measuring a plurality of points on the part when both the part and contact probe are moving continuously between different positions within the coordinate positioning machine. The probe moves, relative to the part, along a scan path such that substantially coincident points that are closely located together along a curve or surface being measured are measured at relatively far apart positions in the machine and at relatively far apart positions along the scan path.