The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Nov. 28, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Mohankumar Valiyambath Krishnan, Eindhoven, NL;
Linfang Xu, Eindhoven, NL;
Wai Lik William Wong, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to a fabric sensor () for determining a fabric type. The fabric sensor () comprises a first structural component () comprising a first sensing surface (), and a second structural component () comprising a second sensing surface (). The first structural component () and the second structural component () are movable relative to each other to form a closed arrangement wherein the first sensing surface () and the second sensing surface () hold the fabric. The fabric sensor () also comprises a thickness measurement mechanism () for measuring a thickness of the fabric when the fabric is held between the first sensing surface () and the second sensing surface (). The fabric sensor () also comprises a processing unit () coupled to the thickness measurement mechanism () and at least one of the first sensing surface () and the second sensing surface (). At least one of the first sensing surface () and the second sensing surface () is adapted to sense a characteristic of the fabric. The processing unit () is configured to determine the fabric type based on the thickness of the fabric and the characteristic of the fabric.