The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Mar. 27, 2014
Applicants:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Korea Advanced Institute of Science and Technology (Kaist), Daejeon, KR;

Inventors:

Chul-Ho Cho, Gyeonggi-do, KR;

De-Sok Kim, Daejeon, KR;

Jae-Geol Cho, Gyeonggi-do, KR;

Sun-Tae Jung, Gyeonggi-do, KR;

Salahuddin Lizawati, Daejeon, KR;

Assignees:

Samsung Electronics Co., Ltd., Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/16 (2006.01); A61B 5/024 (2006.01);
U.S. Cl.
CPC ...
A61B 5/165 (2013.01); A61B 5/024 (2013.01); A61B 5/02405 (2013.01); A61B 5/16 (2013.01);
Abstract

Disclosed is a method and system for analyzing stress and managing stress by using a mobile electronic apparatus and a data management server. The method includes: generating bio-signal pattern information upon periodically receiving a bio-signal from a bio-signal measuring device connected to each of a plurality of unspecified individuals, and forming reference information for stress analysis based on received answers to each of a plurality of questions for checking a stress level; receiving bio-signal pattern information from a bio-signal measuring device connected to a specified user; and determining a stress level corresponding to the bio-signal pattern information of the specified user based on the reference information.


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