The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
May. 02, 2016
Applicant:
Endochoice, Inc., Alpharetta, GA (US);
Inventors:
Itay Sidar, Haifa, IL;
Tal Davidson, Yokneam Ilit, IL;
Achia Kronman, Pardes Hanna, IL;
Yaniv Kirma, Karcur, IL;
Yuri Gershov, Haifa, IL;
Golan Salman, Atlit, IL;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01); A62B 1/04 (2006.01); A61B 1/12 (2006.01); A61B 1/06 (2006.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
A61B 1/128 (2013.01); A61B 1/0676 (2013.01); A61B 1/0684 (2013.01); A61B 1/00006 (2013.01);
Abstract
The present specification describes a system and method for computing the temperature of the tip of a multiple viewing elements endoscope based on a measurement of junction temperatures of light emitting diode (LED) illuminators inside the tip. The measurement of temperature is used for taking corrective action if the temperature exceeds a limit. The temperature measurement is used for optimizing image parameters, as the performance of image sensors is affected by changes in ambient temperature.