The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Jun. 28, 2017
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Yoshio Hagihara, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/378 (2011.01); H04N 5/376 (2011.01); H01L 27/146 (2006.01); H03K 5/06 (2006.01); H03K 5/133 (2014.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/378 (2013.01); H04N 5/3765 (2013.01); H01L 27/14636 (2013.01); H01L 27/14643 (2013.01); H03K 5/06 (2013.01); H03K 5/133 (2013.01); H03K 2005/00078 (2013.01); H03K 2005/00234 (2013.01);
Abstract

An imaging device includes an imaging unit, a reference signal generation unit, m (m is an integer of 3 or more) number of column delay units, and a plurality of column AD conversion units. The plurality of column delay units is arranged so as to correspond to two or more and less than m of the column AD conversion units. Each of the plurality of column delay units includes a first delay circuit. The first delay circuit generates a plurality of first delay clocks. The column AD conversion unit includes a comparison unit, a latch unit, and a counter unit. The comparison unit compares a pixel signal with a reference signal, and outputs a control signal corresponding to a comparison result. The latch unit includes a plurality of latch circuits that latches the plurality of first delay clocks on the basis of a state change of the control signal.


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