The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Jun. 29, 2015
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Yoshihiro Kawano, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
It is possible to readily observe pathology specimens without spending much time and suspected pathology specimens in detail. A specimen observation device comprises an image capturing unit acquiring a partial image representing at least a part of one of multiple pathology specimens mounted on an accommodating section and a whole image of the multiple pathology specimens mounted on the accommodating section; an input unit inputting identification information of the accommodating section; a display unitdisplaying an enlarged version of the partial image acquired by the image capturing unit); an image designating unit designating the partial image displayed on the display unit; and a storage unit storing the identification information input via the input unit and a position of the partial image designated via the image designating unit in relation to the whole image such that the position and the identification information are associated with the whole image.