Synchronous, internal clock edge alignment for integrated circuit testing

Abstract

A synchronous clock edge alignment system and method increases detection coverage of transition delay faults that occur in logic circuits that have data released by a clock at an input of logic circuits internal to an integrated circuit and/or released at the output of the logic circuits when testing an integrated circuit. To increase detection coverage of inter-clock transition delay faults, in at least one embodiment, the synchronous clock edge alignment system and method align same transition type edges of internal data releasing clock signals, and at least two of the clock signals have different frequencies. By aligning the edges of the clock signals, transition delay faults that might otherwise not have occurred can be detected by, for example, a conventional circuit testing apparatus. Thus, aligning the edges of the clock signals increases detection of inter-clock transition delay faults.