The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Jan. 06, 2016
Applicant:
Korea Research Institute of Standards and Science, Daejeon, KR;
Inventors:
Bok Lae Cho, Daejeon, KR;
In Young Park, Daejeon, KR;
Assignee:
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/06 (2006.01); H01J 37/065 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/065 (2013.01); H01J 37/06 (2013.01); H01J 37/26 (2013.01); H01J 2237/061 (2013.01); H01J 2237/06341 (2013.01);
Abstract
The present invention relates to an electron gun for facilitating position adjustment, and an electron microscope including the same, the electron gun improving a vacuum structure so as to easily move a filament block or an electron tip of an electron gun without having bellows for maintaining a vacuum when the center axis of the filament block or the electron tip of the electron gun is mechanically misaligned with the center axis of a anode and a focusing lens.