The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Nov. 21, 2016
The Boeing Company, Chicago, IL (US);
James H. Lee, Ravensdale, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Disclosed are apparatus and methods determining a center offset distance for computed tomography (CT) imaging. A specimen is positioned between an emission source for outputting radiation towards the specimen while the specimen rotates with respect to a detector for receiving radiation that has passed through the specimen. A center calibration indicator (CCI) is also positioned near the specimen so that at least a portion of the radiation passes through the CCI onto the detector. Projection data is collected from emissions received at the detector for multiple rotational positions of the specimen relative to the detector. A sinogram image is generated based on the projection data. Two alignment points corresponding to the CCI are located in the sinogram and used to determine the center offset distance for the sinogram. A specimen image is reconstructed by back projecting the sinogram using the determined center offset distance.