The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Nov. 21, 2016
The Boeing Company, Chicago, IL (US);
James H. Lee, Ravensdale, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Disclosed are apparatus and methods determining a center offset distance for computed tomography imaging. A specimen is positioned between an emission source for outputting radiation towards the specimen while the specimen rotates with respect to a detector for receiving radiation that has passed through the specimen. Projection data is collected from emissions received at the detector for multiple rotational positions of the specimen. A sinogram image is generated based on the projection data. The sinogram image is divided into image portions, which are superimposed and iteratively moved relative to each other by a relative offset so that a superimposed image peak in such superimposed image portions has a maximized height. A center offset distance for the sinogram image is defined as a relative offset between the superimposed image portions that results in the maximized height. If the center offset distance is zero, the superimposed image portions will be superimposed so that their edges are aligned to result in the maximized height. A specimen image is reconstructed using the determined center offset distance.