The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Aug. 03, 2017
Applicant:

Morphotrak, Llc, Anaheim, CA (US);

Inventors:

Hui Chen, Foothill Ranch, CA (US);

Peter Zhen-Ping Lo, Mission Viejo, CA (US);

Assignee:

MorphoTrak, LLC, Anaheim, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06K 9/03 (2006.01); G06K 9/52 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00093 (2013.01); G06K 9/00073 (2013.01); G06K 9/03 (2013.01); G06K 9/52 (2013.01); G06K 9/6215 (2013.01); G06K 2009/4666 (2013.01);
Abstract

In some implementations, a computer-implemented method may include: identifying one or more neighboring minutiae within a particular octant neighborhood for the octant feature vector for each minutia included in a list of minutiae associated with a search fingerprint; computing, for each minutia included in the list of minutiae, a direction difference between each minutia included in the list of minutiae, and each of the one or more neighboring minutiae identified for the octant feature vector for each minutia included in the list of minutiae; computing, for each minutia included in the list of minutiae, a minutia quality confidence; and computing a fingerprint quality confidence.


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Chen, Hui. (2018). Derived virtual quality parameters for fingerprint matching (U.S. Patent No. 10127432). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10127432

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