The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Dec. 16, 2016
Applicant:

Square, Inc., San Francisco, CA (US);

Inventors:

Jeremy Wade, San Francisco, CA (US);

Sean Michael Hafemann, Lafayette, CA (US);

Assignee:

Square, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/08 (2006.01); G06K 7/06 (2006.01);
U.S. Cl.
CPC ...
G06K 7/06 (2013.01);
Abstract

Disclosed is a technique for prevention of false tamper positives experienced by an electronic device by use of a custom profile. The technique includes electrically coupling a conductive trace to a tamper monitoring component for use in tamper detection on the trace. Upon occurrence of the threshold voltage on the conductive trace, a tamper event is detected. A second conductive trace is monitored over time to determine behavior of the device. If the device is likely to trigger tamper responses in response to change in environment, the threshold voltage is changed to tamper positives triggered by environment.


Find Patent Forward Citations

Wade, Jeremy. (2018). Tamper detection system (U.S. Patent No. 10127409). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10127409

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…