The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Dec. 09, 2015
Sap SE, Walldorf, DE;
Archana Shridhar, Bangalore, IN;
Sahana Durgam Udaya, Bangalore, IN;
SAP SE, Walldorf, DE;
Abstract
Impact analysis of an object is performed by selecting an object and determining impacted objects corresponding to the object. A type of the object is determined. A query is formulated and executed to retrieve relationship objects from a relationship table matching the type of the selected object. Nested properties associated with the relationship objects for the individual relationship objects are determined iteratively. A parent property associated with the nested properties is identified. A query is formulated and executed to fetch dependent values corresponding to the dependent values. The dependent values are added to a list. A query is formulated and executed to determine impacted objects corresponding to the dependent values. The impacted objects are displayed in a graphical chart.