The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Oct. 24, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rick A. Hamilton, II, Charlottesville, VA (US);

Jorge Alonso Hernandez Nevarez, Jalisco, MX;

Agueda Martinez Hernandez Magro, Zapopan, MX;

Jose Roberto Mosqueda Mejia, Michoacan, MX;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3664 (2013.01); G06F 11/3668 (2013.01);
Abstract

A method, system and computer program product for defining an evolving set of test cases for testing software applications. In an embodiment, the method comprises identifying a set of criteria for the test cases; assigning a weight to each of the criteria; and for each of a multitude of test cases, assigning a value to each of the criteria, and determining a criteria score for the test case based on the values assigned to the criteria for the test case and the weights assigned to the criteria. Each of the test cases is assigned to one of a plurality of groups based on the criteria scores. Each of the groups of test cases is associated with one of a plurality of testing procedures, and one of those procedures is selected to test a software application using the group of test cases associated with that selected testing procedure.


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