The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Oct. 09, 2014
Hcl Technologies Ltd., Chennai, IN;
Dhanyamraju S U M Prasad, Hyderabad, IN;
Satya Sai Prakash K, Hyderabad, IN;
Simy Chacko, Hyderabad, IN;
Sekhar Ramaraju, Secunderabad, IN;
Sankar Pabba, Warangal, IN;
HCL TECHNOLOGIES LTD., Chennai, Tamil Nadu, IN;
Abstract
Defect classification and association in a software development environment. The embodiments herein relates to a software development environment, and more particularly to managing defects in a software development environment. The defect management engine may use information present in the code repository to create a master list of features and/or sub-features. Using the master list, the defect management engine may scan and parse all reported defects (which may be present in the defect repository). The defect management engine may associate defects with features present in the master list. The defect management engine may then extract the test cases and map the test cases to the defects. The defect management engine may determine the test coverage metric and the test case sufficiency metric. The defect management engine may also label unmapped defects as orphan defects.