The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Oct. 21, 2016
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Mythili Krishnan, Bangalore, IN;

Vijay Desai, San Diego, CA (US);

Narayanaswamy Thimmappa, Bangalore, IN;

Mriga Bansal, Bangalore, IN;

Kunal Bhowmick, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01); G06F 11/34 (2006.01); G06F 11/07 (2006.01); G06F 11/30 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2257 (2013.01); G06F 11/008 (2013.01); G06F 11/0706 (2013.01); G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/0793 (2013.01); G06F 11/302 (2013.01); G06F 11/3476 (2013.01); G06N 5/022 (2013.01); G06F 2201/81 (2013.01);
Abstract

Data from an application is analyzed periodically in real-time using a predictive data model to predict potential application failures. Application logs are used to build the predictive data model. The predictive data model includes features created from the application logs which are good predictors of application failures. The predictive data model analyzes and provides anomaly scores for various anomalies for the real-time data collected over a time period. The anomaly scores are compared with a threshold score to predict the probability of occurrences of application failures. If there is a higher probability of occurrence of an incident of application failure, corrective actions to mitigate or reduce the probability of occurrence of the application failure are implemented.


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