The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Sep. 07, 2016
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Igor Genshaft, Bat Yam, IL;

Marina Frid, Jerusalem, IL;

Jonathan Journo, Shaarey Tikwa, IL;

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 12/1009 (2016.01); G06F 3/06 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 3/0685 (2013.01); G06F 12/1009 (2013.01); G11C 29/52 (2013.01); G06F 2212/1032 (2013.01); G06F 2212/657 (2013.01);
Abstract

A system and method is disclosed for detecting and correcting for errors in mapping table information stored in volatile memory of a non-volatile memory system. The method may include checking for mapping entry errors when retrieving mapping data for the non-volatile memory from a volatile memory cache. When an error is discovered, the method includes the processor generating a set of candidate mapping entries each having a different single bit difference from the mapping entry discovered to have an error. Each candidate is tested against one or more mapping data accuracy tests and, when one of the candidates is found to be a correct mapping entry based on the one or more tests, the original mapping table entry with the determined defect is replaced with the successful candidate mapping entry.


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