The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Feb. 07, 2014
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

Shih-Wen Chen, New Taipei, TW;

Chun-Chieh Li, New Taipei, TW;

Ya-Ping Lin, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/042 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/042 (2013.01); G06F 3/0418 (2013.01);
Abstract

A testing method of a touch device and a system thereof are provided. The testing method includes following steps. A test sensing information generated by the touch device is received, and the test sensing information is physical characteristic information provided by sensors of the touch device. A test gesture signal and a test keypad signal generated by the touch device are received, the test gesture signal includes gesture coordinates provided by touch device, and the test keypad signal includes a keypad key triggering signal generated by the touch device. According to a preset table, in order to generate a test result, whether the test sensing information, the test gesture signal, and the test keypad signal match data of the preset table or not is determined, and whether the touch device works properly is determined according to the test result.


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