The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Jun. 18, 2014
Compagnie Generale Des Etablissements Michelin, Clermont-Ferrand, FR;
Michelin Recherche ET Technique S.a., Granges-Paccot, CH;
William David Mawby, Greenville, SC (US);
COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN, Clermont-Ferrand, FR;
Abstract
Methods and systems for improving tire uniformity through identification of characteristics of one or more candidate process effects are provided. The magnitudes of process harmonics associated with one or more candidate process effects can be identified by combining uniformity measurements for a set of tires to achieve an enhanced resolution for a sampling of the process harmonic. The enhanced resolution approach can combine uniformity measurements for a set of a plurality of tires that are slightly offset from one another to generate a composite process harmonic sampling. In particular, the composite process harmonic sampling can be generated by aligning the uniformity measurements for each tire in the set of tires based on the azimuthal location of the maximum magnitude of the process harmonic on each tire. The magnitude of the process harmonic can then be determined using the composite process harmonic sampling.