The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Nov. 03, 2016
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Masaki Namie, Takatsuki, JP;

Mikiko Manabe, Takatsuki, JP;

Assignee:

OMRON Corporation, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F16D 48/06 (2006.01); F16D 48/02 (2006.01); G05B 13/02 (2006.01); G05B 13/04 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 13/026 (2013.01); G05B 13/048 (2013.01); G05B 23/0254 (2013.01);
Abstract

A characteristic change, disturbance, and an abnormal state are accurately detected with no use of a high-accuracy simulation model. A control device for controlling a control target includes a predictive value calculator that outputs a predictive value of an output value to an input value with respect to a model of the control target, a prediction error calculator that calculates a relational value indicating a relationship between the predictive value and a measured value of output of the control target; and a change detector that compares a first relational value to a second relational value, the first relational value being the relational value in a reference state in which the control target operates normally, the second relational value being the relational value in an operating state in which the control target is operated.


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