The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Jun. 28, 2017
Applicant:

Eastman Kodak Company, Rochester, NY (US);

Inventors:

Chung-Hui Kuo, Fairport, NY (US);

Stacy M. Munechika, Fairport, NY (US);

Frederick Edward Altrieth, III, Scottsville, NY (US);

Assignee:

EASTMAN KODAK COMPANY, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/043 (2006.01); G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/55 (2013.01); G03G 15/043 (2013.01);
Abstract

A method is described for calibrating a linear printhead including an array of light sources. A test target is printed by activating the light sources in the printhead in accordance with digital image data for the test target, wherein a current value for each light source is controlled responsive to an initial set of current control parameters. A digital image capture system is used to capture an image of the printed test target, and the captured digital image is analyzed to determine an estimated exposure gain error for each light source. An updated set of current control parameters is then determined which is adapted to compensate for the estimated exposure gain errors.


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