The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Jul. 12, 2016
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Display Technology Co., Ltd., Beijing, CN;

Inventors:

Zhixiao Yao, Beijing, CN;

Bin Feng, Beijing, CN;

Yuxi Wang, Beijing, CN;

Weitao Chen, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1343 (2006.01); G02F 1/1339 (2006.01); G02F 1/1345 (2006.01); C09J 9/02 (2006.01); C09J 11/04 (2006.01); C08K 7/18 (2006.01); C08K 3/08 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1339 (2013.01); C09J 9/02 (2013.01); C09J 11/04 (2013.01); G02F 1/1345 (2013.01); G02F 1/134309 (2013.01); C08K 7/18 (2013.01); C08K 2003/0806 (2013.01); C08K 2003/0831 (2013.01); C08K 2201/001 (2013.01); G02F 2201/121 (2013.01); G02F 2201/123 (2013.01); G02F 2202/28 (2013.01);
Abstract

A liquid crystal display panel, a sealing performance testing method thereof and a display device are provided. In the liquid crystal display panel, a side of the array substrate facing the opposed substrate is provided with a plurality of independent first conductive portions, a side of the opposed substrate facing the array substrate is provided with a plurality of independent second conductive portions, sealant is an anisotropic conductive adhesive, all of the first conductive portions and all of the second conductive portions are electrically connected through the sealant to form an unclosed conductor surrounding a display region; by testing a resistance value between any two first conductive portions on the array substrate, it can be determined that there is a micro gap or breaking sealant problem upon the resistance value being abnormal.


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