The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Jul. 27, 2015
The Regents of the University of California, Oakland, CA (US);
Carlos J. Bustamante, Berkeley, CA (US);
Troy A. Lionberger, Berkeley, CA (US);
Yves Coello, Lima, PE;
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
A drift-adjusted interferometer and optical trap are disclosed that employ two reference beams with an optical property that allows them to be separated from the two trapping beams. The reference and trapping beams are combined collinearly and optically inverted so that each reference beam overlays with the opposite trapping beam. Each pair of beams is then focused on a microsphere and the resulting four back-focal plane interferometry signals are monitored such that the relative motion between a given trapping beam with its overlaid reference beam provides a direct measurement of the physical drift occurring due to mechanical drift of the differential path components.