The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Oct. 21, 2016
Quality Vision International, Inc., Rochester, NY (US);
David E. Lawson, Webster, NY (US);
Stephanie M. Bloch, Penfield, NY (US);
Quality Vision International, Inc., Rochester, NY (US);
Abstract
A method of focusing a telecentric imaging system (), particularly as a part of a measuring machine () includes measuring an image of a feature () of an object () through the telecentric imaging system () in a telecentric operating mode and measuring an image of the feature () of the object () through the telecentric imaging system () in a non-telecentric operating mode. A value is acquired characterizing a function by which the size of the imaged feature varies in the non-telecentric mode with the relative displacement of the object () through the depth of field (D). The measures of the image of the feature () of the object () in the telecentric and non-telecentric modes are related to each other and to the acquired value as an estimate of a relative displacement of the object () from the best focus position.