The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10126537 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 13, 2018

Filed:

Sep. 14, 2017
Applicant:

Enplas Corporation, Saitama, JP;

Inventor:

Takahiro Izawa, Saitama, JP;

Assignee:

ENPLAS CORPORATION, Saitama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 17/00 (2006.01); G02B 17/08 (2006.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
G02B 17/08 (2013.01); G02B 3/005 (2013.01); G02B 3/0056 (2013.01);
Abstract

A marker includes a plurality of convex lenses each including a plurality of convex lenses each including a convex surface part on a front side; and a plurality of patterns formed on a rear surface of the plurality of convex lenses, each pattern corresponding to the convex surface part. Each of the plurality of patterns is composed of optically distinguishable first and second parts formed by a surface shape of the rear surface. The second part is disposed on each corresponding convex surface part. A distance between optical axes of the convex lenses which are adjacent is constant. A distance between centers of the second parts which are adjacent is different from the distance between the optical axes.


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Izawa, Takahiro. (2018). Marker (U.S. Patent No. 10126537). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10126537

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