The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Jun. 02, 2015
Case Western Reserve University, Cleveland, OH (US);
Tiejun Zhao, Pittsburgh, PA (US);
Kecheng Liu, Solon, OH (US);
Dan Ma, Cleveland Heights, OH (US);
Mark Griswold, Shaker Heights, OH (US);
Case Western Reserve University, Cleveland, OH (US);
Abstract
Example apparatus and methods provide improved quantitative T2 mapping for magnetic resonance imaging (MRI). Conventional T2 (spin-spin) mapping in MRI may employ a spin echo with multiple echoes (SEMC) approach like the Carr-Purcell-Meiboom-Gill (CPMG) spin echo sequence. These conventional approaches may be negatively impacted by a slice profile effect that incorrectly and undesirably lowers the signal of a first echo and by a stimulated echo effect that incorrectly and undesirably raises the signal for even echoes. Example apparatus mitigate these issues by using a T2 preparation phase that uses three dimensional (3D) non-slice selective block RF pulses followed by a multi-echo data acquisition that uses an in-out k-space trajectory. The multi-echo acquisition may employ k-space segmentation to acquire one line of partition encodings per T2 preparation phase. While conventional systems mix T2 preparation and multi-echo acquisition, example apparatus and methods separate T2 preparation and multi-echo acquisition.