The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Jul. 20, 2016
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventor:

Istvan Novak, Bedford, MA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2014.01); G01R 13/20 (2006.01); G01R 31/44 (2006.01);
U.S. Cl.
CPC ...
G01R 31/40 (2013.01); G01R 13/20 (2013.01); G01R 31/44 (2013.01);
Abstract

Methodologies and systems are described herein whereby the electrical performance of a device may be tested. In one or more embodiments, a system for testing the electrical performance comprises a monitoring device configured to perform a set of operations including concurrently monitoring at least three different test points of a device under test (DUT) and aggregating test data comprising signal information collected concurrently from at least three different test points of the DUT. In one or more embodiments, the system is configured to monitor at least three channels wherein at least one channel corresponds to a frequency range of less than 300 kHz and the phases of signals on at least three channels are different.


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