The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Mar. 23, 2015
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Tommaso Bacigalupo, Fuerstenfeldbruck, DE;

Marco Bachhuber, Neuried, DE;

Marcus Nuebling, Olching-Esting, DE;

Laurent Beaurenaut, Neubiberg, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3187 (2006.01); G01R 31/26 (2014.01); G05F 1/00 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2621 (2013.01); G01R 31/3187 (2013.01); G05F 1/00 (2013.01); H01L 21/00 (2013.01); H01L 2221/00 (2013.01);
Abstract

A gate driver is described that includes a gate signal module configured to output a gate signal of the gate driver for driving a gate terminal of a semiconductor device. The gate driver further includes a test module configured to generate a simulated failure condition at a semiconductor device during a test of a monitoring and protection feature of the gate driver. The gate drier further includes a monitor module configured to output an indication of the simulated failure condition in response to detecting the simulated failure condition at the semiconductor device.


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