The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Aug. 24, 2015
Centre National D'etudes Spatiales C N E S, Paris, FR;
Jacques Sombrin, Toulouse, FR;
Isabelle Albert, Escalquens, FR;
Geoffroy Soubercaze-Pun, Flourens, FR;
Nicolas Capet, Toulouse, FR;
CENTRE NATIONAL D'ETUDES SPATIALES C N E S, Paris, FR;
Abstract
A process and a device for measuring intermodulation products by wave reflection on a non-linear object (), including two electromagnetic sources () of distinct focal points emitting fundamental components, and a receiver (), the process includes a step in which the measuring device is in a configuration so that the receiver () produces a signal for a first composition of the enriched wave (), and a second step in which the measuring device is in a second configuration so that the receiver () produces a measuring signal for a second composition of the enriched wave ().