The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Jun. 06, 2017
Applicants:

Robert E. Stewart, Woodland Hills, CA (US);

Michael D. Bulatowicz, Sun Prairie, WI (US);

Inventors:

Robert E. Stewart, Woodland Hills, CA (US);

Michael D. Bulatowicz, Sun Prairie, WI (US);

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01); G01P 15/125 (2006.01); G01P 15/13 (2006.01); G01P 15/08 (2006.01);
U.S. Cl.
CPC ...
G01P 21/00 (2013.01); G01P 15/125 (2013.01); G01P 15/131 (2013.01); G01P 2015/084 (2013.01); G01P 2015/0828 (2013.01); G01P 2015/0831 (2013.01);
Abstract

One embodiment includes a method for dynamic self-calibration of an accelerometer system. The method includes forcing a proof-mass associated with a sensor of the accelerometer system in a first direction to a first predetermined position and obtaining a first measurement associated with the sensor in the first predetermined position via at least one force/detection element of the sensor. The method also includes forcing the proof-mass to a second predetermined position and obtaining a second measurement associated with the sensor in the second predetermined position via the at least one force/detection element of the sensor. The method further includes calibrating the accelerometer system based on the first and second measurements.


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