The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Mar. 02, 2017
Applicant:

Washington State University, Pullman, WA (US);

Inventors:

Wenjie Liu, Xinjiang, CN;

Herbert H. Hill, Jr., Pullman, WA (US);

William F. Siems, Spokane, WA (US);

Assignee:

WASHINGTON STATE UNIVERSITY, Pullman, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); G01N 27/62 (2006.01); H01J 49/00 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); H01J 49/0031 (2013.01); H01J 49/0036 (2013.01); H01J 49/061 (2013.01);
Abstract

The methods herein provide for analysis of ion populations. Certain aspects include: directing a continuous gas phase ion beam into an entrance of a drift tube configured within an ion mobility spectrometer; perturbing the flow of the continuous gas phase ion beam within a perturbation time range so as to cause one or more configured perturbations; configuring the drift tube to allow the one or more perturbations to separate due to the differences in mobilities; receiving the plurality of ions and the one or more perturbations at the entrance of a mass spectrometer; recording raw data indicative of the plurality of ions; and reconstructing the raw data to obtain one or more mass to charge and one or more ion mobility spectrum of the plurality of ions.


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