The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Dec. 14, 2016
Applicant:

Elwha Llc, Bellevue, WA (US);

Inventors:

Rachel Cannara, Kirkland, WA (US);

Fred Sharifi, Kirkland, WA (US);

Alex Smolyanitsky, Boulder, CO (US);

Assignee:

Elwha LLC, Bellevue, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G01N 23/20066 (2018.01); G01N 23/046 (2018.01); A61B 6/03 (2006.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20066 (2013.01); G01N 23/046 (2013.01); A61B 6/032 (2013.01); G01N 2223/063 (2013.01); G01N 2223/501 (2013.01); G01V 5/005 (2013.01);
Abstract

A detection pixel includes a material that is chosen so that its (averaged) atomic number density leads to the Compton process being the dominant scattering mechanism in response to incident photons, leading to production of Compton electrons with sufficient number and kinetic energy to produce an electric or magnetic response in the material. The incident photon and Compton electrons each have a characteristic travel distance in the material, and the detection pixel has at least one dimension that is selected according to a range defined by these characteristic travel distances. The detection pixels may be arranged in an array for imaging.


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