The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

Jul. 28, 2016
Applicant:

Zeon Chemicals L.p., Louisville, KY (US);

Inventors:

David J. McDonald, Hattiesburg, MS (US);

Mark Allen, Louisville, KY (US);

Assignee:

Zeon Chemicals L.P., Louisville, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/34 (2006.01); G01N 21/88 (2006.01); G01N 21/94 (2006.01); B07C 5/342 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); B07C 5/3422 (2013.01); G01N 21/94 (2013.01); G01N 2201/0461 (2013.01); G01N 2201/062 (2013.01);
Abstract

An inspection system for inspecting rubber crumb includes a conveyor, lighting, a camera, and a controller. The conveyor is used to carry the rubber crumb. The lighting is positioned above the conveyor to illuminate the rubber crumb with at least 3,500 lumens. The camera is positioned adjacent to the lighting to take images of the illuminated rubber crumb in the lighted area. The controller receives the images from the camera and detects a contamination in the rubber crumb by determining whether there is a dark particle within the crumb. If a contamination is detected, it may be removed from the remaining rubber crumb.


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