The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Mar. 17, 2017
B&w Tek Llc, Newark, DE (US);
Jun Zhao, The Woodlands, TX (US);
Xin Jack Zhou, Hockessin, DE (US);
Sean Xiaolu Wang, Wilmington, DE (US);
B&W TEK LLC, Newark, DE (US);
Abstract
This invention relates to a light delivery and collection device for performing spectroscopic analysis of a subject. The light delivery and collection device comprises a reflective cavity with two apertures. The first aperture is configured to receive excitation light which then diverges and projects onto the second aperture. The second aperture is configured to be applied close to the subject such that the reflective cavity substantially forms an enclosure covering a large area of the subject. The excitation light enters and interacts with the covered area of the subject to produce inelastic scattering and/or fluorescence emission from the subject. The reflective cavity has a specular reflective surface with high reflectivity to the excitation light as well as to the inelastic scattering and/or fluorescence emission from the subject. The reflective cavity reflects the excitation light that is reflected and/or back-scattered from the subject and redirects it towards the subject. This causes more excitation light to penetrate into a diffusely scattering subject to produce inelastic scattering and/or fluorescence emission from inside of the subject hence enabling sub-surface measurement. In addition, the reflective cavity reflects the inelastic scattering and/or fluorescence emission from the subject unless the inelastic scattering and/or fluorescence emission either emits from the first aperture of the reflective cavity to be measured with a spectrometer device, or re-enters the subject at the second aperture. This multi-reflection process improves the collection efficiency of the inelastic scattering or fluorescence emission from the subject.