The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Nov. 08, 2017
Hach Lange Gmbh, Berlin, DE;
Manfred Battefeld, Duesseldorf, DE;
Michael Kussmann, Duesseldorf, DE;
Bas De Heij, Dormagen, DE;
Bernd Gassner, Neuss, DE;
Frank Steinhauer, Berlin, DE;
Hans-Joachim Kumpch, Berlin, DE;
Axel Leyer, Moenchengladbach, DE;
Michael Kueppers, Kaarst, DE;
Andreas Golitz, Moers, DE;
Andreas Mitreiter, Kleinmachnow, DE;
Clemens Hanschke, Berlin, DE;
Lothar Heidemanns, Korschenbroich, DE;
HACH LANGE GMBH, Berlin, DE;
Abstract
A method for detecting a contamination of a cuvette of a turbidimeter. The turbidimeter includes a light source which emits a light beam directed to a cuvette, a scattering light detector, and a diffuser with a body and an actuator. The actuator moves the body between a parking position and a test position where the body is between the measurement light source and the cuvette, thereby interferes with the light beam, and generates a diffuse test light entering the cuvette. The method includes activating the actuator to move the body from the parking position into the test position, activating the light source, measuring a test light intensity received by the scattering light detector, comparing the test light intensity measured with a reference light intensity, and generating a contamination signal if a difference between a reference light intensity and the test light intensity measured exceeds a first threshold value.