The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Feb. 08, 2018
Samsung Electronics Co., Ltd., Suwon-si, KR;
Sung Ha Park, Suwon-si, KR;
Sang Bum Park, Hwaseong-si, KR;
Beom Seok Lee, Osan-si, KR;
Kui Hyun Kim, Hwaseong-si, KR;
Joo Hee Park, Yongin-si, KR;
Kyung Mi Song, Suwon-si, KR;
Euy Hyun Cho, Suwon-si, KR;
Ha Na Kim, Yongin-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.