The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Sep. 12, 2012
Applicant:

Mitsuo Imai, Okazaki, JP;

Inventor:

Mitsuo Imai, Okazaki, JP;

Assignee:

FUJI CORPORATION, Chiryu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 13/08 (2006.01); H05K 3/30 (2006.01); H05K 13/04 (2006.01);
U.S. Cl.
CPC ...
H05K 13/08 (2013.01); H05K 3/303 (2013.01); H05K 13/0404 (2013.01); H05K 2203/163 (2013.01); Y10T 29/49131 (2015.01); Y10T 29/53174 (2015.01);
Abstract

A substrate process system which includes a plurality of arranged process machines, and in which a circuit substrate is transported from an upstream process machine to a downstream process machine is provided. One process machine inspects small electronic components, and another process machineinspects large electronic components. The small mounted components are inspected in detail. When the large mounted components are inspected, it is not necessary to inspect the large electronic components in detail to the degree that the small electronic components are inspected. It is possible to reliably inspect the small mounted components even though the inspection process requires a certain length of time, and it is possible to inspect the large components in less detail than the inspection process for the small components. Accordingly, it is possible to reliably perform an inspection process, and to decrease an inspection time at the same time.


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