The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Jul. 10, 2017
Applicant:

Flir Systems, Inc., Wilsonville, OR (US);

Inventors:

Mark Nussmeier, Goleta, CA (US);

Eric A. Kurth, Santa Barbara, CA (US);

Nicholas Högasten, Santa Barbara, CA (US);

Theodore R. Hoelter, Goleta, CA (US);

Katrin Strandemar, Rimbo, SE;

Pierre Boulanger, Goleta, CA (US);

Barbara Sharp, Santa Barbara, CA (US);

Assignee:

FLIR Systems, Inc., Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H04N 5/225 (2006.01); H04N 5/378 (2011.01); H04N 5/357 (2011.01); H04M 1/725 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); H04N 5/2252 (2013.01); H04N 5/2257 (2013.01); H04N 5/357 (2013.01); H04N 5/378 (2013.01); H04M 1/725 (2013.01); H04M 2250/52 (2013.01);
Abstract

Various techniques are provided for implementing an infrared imaging system. In one example, a system includes a focal plane array (FPA). The FPA includes an array of infrared sensors adapted to image a scene. The FPA also includes a bias circuit adapted to provide a bias voltage to the infrared sensors. The bias voltage is selected from a range of approximately 0.2 volts to approximately 0.7 volts. The FPA also includes a read out integrated circuit (ROIC) adapted to provide signals from the infrared sensors corresponding to captured image frames. Other implementations are also provided.


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