The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Jul. 26, 2017
Lookout, Inc., San Francisco, CA (US);
Kevin Patrick Mahaffey, San Francisco, CA (US);
Timothy Micheal Wyatt, Toronto, CA;
Brian James Buck, Livermore, CA (US);
John Gunther Hering, San Francisco, CA (US);
Amit Gupta, San Francisco, CA (US);
Alex Cameron Abey, Livermore, CA (US);
LOOKOUT, INC., San Francisco, CA (US);
Abstract
Data is collected from a set of devices according to a data collection policy. The data is associated with device configuration, device state, or device behavior. A norm is established using the collected data. A different data collection policy is established based on the norm. Data is collected from a particular device according to the different data collection policy. The norm is compared to the data collected from the particular device. If there is a deviation outside of a threshold deviation between the norm and the data collected from the particular device, a response is initiated.