The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Oct. 28, 2016
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Fanny Marticke, Grenoble, FR;

Guillaume Montemont, Grenoble, FR;

Caroline Paulus, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2018.01); G21K 1/02 (2006.01); G01N 23/087 (2018.01); G01N 23/20091 (2018.01);
U.S. Cl.
CPC ...
G21K 1/025 (2013.01); G01N 23/087 (2013.01); G01N 23/20091 (2013.01); G01N 2223/05 (2013.01);
Abstract

The invention relates to the field of the analysis of objects by x-ray diffraction spectroscopy. One subject of the invention is a device for analyzing an object by x-ray diffraction spectroscopy, comprising a collimator the shape of which allows various portions of an object to be analyzed simultaneously. To do this, the collimator includes channels inclined with respect to an axis, called the central axis of the collimator, in such a way that various channels address various elementary volumes distributed through the object. Another subject of the invention is a method allowing an object to be analyzed using such a device. The object may for example be a biological tissue that it is desired to characterize non-invasively and non-destructively.


Find Patent Forward Citations

Loading…