The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Jun. 30, 2015
Duke University, Durham, NC (US);
Yuan Lin, Durham, NC (US);
Ehsan Samei, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
Spectral estimation and poly-energetic reconstructions methods and x-ray systems are disclosed. According to an aspect, a spectral estimation method includes using multiple, poly-energetic x-ray sources to generate x-rays and to direct the x-rays towards a target object. The method also includes acquiring a series of poly-energetic measurements of x-rays from the target object. Further, the method includes estimating cross-sectional images of the target object based on the poly-energetic measurements. The method also includes determining path lengths through the cross-sectional images. Further, the method includes determining de-noised poly-energetic measurements and de-noised path lengths based on the acquired poly-energetic measurements and the determined path lengths. The method also includes estimating spectra for angular trajectories of a field of view based on the de-noised poly-energetic measurements and the path lengths.