The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Dec. 20, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Dmitri Katchalov, Neutral Bay, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A method of determining alignment data for a target frame and a reference frame. Patch data is received for each of a plurality of reference patches of the reference frame. The patch data comprises a reference direction of a feature in an associated reference patch and a reference signal corresponding to a projection of reference patch image data in a direction substantially perpendicular to the reference direction. A shift between at least one of said reference patches and a corresponding target patch in the target frame is determined using the reference signal associated with the reference patch and a target signal corresponding to a projection of the target patch image data in the direction substantially perpendicular to the reference direction associated with said reference patch. The alignment data for the target frame is determined using the determined shift for the reference patch.