The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
May. 25, 2016
Mission Infrared Electro Optics Technology Co., Ltd, Hangzhou, Zhejiang, CN;
Hao Wang, Zhejiang, CN;
MISSION INFRARED ELECTRO OPTICS TECHNOLOGY CO., LTD, Hangzhou, CN;
Abstract
A device and method for analyzing thermal images, a configuration device and method relates to fields of thermal image detection. In the prior art, when configuring orders of analysis areas are different, parts of photographed objects to which the analysis areas correspond with the same number may be different, thereby causing a series of problems. In this invention, a reference image is controlled to be displayed in an infrared thermal image, the reference image reflects specified morphological characters of a photographed object, and a configured analysis area is associated with information related to part information. Thus, the configured analysis area is normative and easy to be understood.