The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Jul. 20, 2016
Okinawa Institute of Science and Technology School Corporation, Okinawa, JP;
Faisal Mahmood, Baltimore, MD (US);
Märt Toots, Tallinn, EE;
Lars-Göran Wallentin Öfverstedt, Okinawa, JP;
Bo Ulf Skoglund, Okinawa, JP;
Abstract
A method for performing 2-dimensional discrete Fourier transform of a subject image data to be performed in one or more digital processors includes performing 1-dimensional fast Fourier transform on each row of the subject image data and 1-dimensional fast Fourier transform on each column of the subject image, and performing a simplified fast Fourier transform processing on the extracted boundary image without performing column-by-column 1-dimensional fast Fourier transform by: performing 1-dimensional fast Fourier transform only on a first column vector in the extracted boundary image data, using scaled column vectors to derive fast Fourier transform of remaining columns of the extracted boundary image data, and performing 1-dimensional fast Fourier transform on each row of the extracted boundary image data. Then, fast Fourier transform of a periodic component of the subject image data with edge-artifacts removed and fast Fourier transform of a smooth component of the subject image data are derived from results of steps (b) and (c).