The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Jul. 28, 2016
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

J. Kent Harbaugh, Burbank, CA (US);

Michael W. Whitt, Redondo Beach, CA (US);

Theagenis J. Abatzoglou, Huntington Beach, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); H04L 29/08 (2006.01); G01S 7/41 (2006.01); G01S 13/00 (2006.01); G01S 13/10 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4007 (2013.01); G01S 7/41 (2013.01); G01S 13/00 (2013.01); G01S 13/10 (2013.01); H04L 67/12 (2013.01);
Abstract

Embodiments of a device and a frequency data extrapolator are generally described herein. The frequency data extrapolator may receive input frequency data mapped to a two-dimensional frequency grid. As an example, the input frequency data may be based on return signals received, at a sensor of the device, in response to pulsed transmissions of the sensor in a physical environment. Regions of the frequency grid may be classified as high fidelity or low fidelity. A group of basis rectangles may be determined within the high fidelity regions. A column-wise extrapolation matrix and a row-wise extrapolation matrix may be determined based on the input frequency data of the basis rectangles. The input frequency data of the high fidelity regions may be extrapolated to replace the input frequency data of the low fidelity regions.


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