The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Mar. 31, 2016
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Hikoyuki Kawata, Kawasaki, JP;

Masaki Tosaka, Kawasaki, JP;

Kumiko Teramae, Setagaya, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5036 (2013.01); G06F 2217/82 (2013.01);
Abstract

An information processing device include: a memory; and one or more processors which are coupled to the memory, wherein the one or more processors performs a process including verifying a quality of a signal waveform that is propagated through focused wiring on a substrate; and storing information which is used for the verification of the quality of the signal waveform, and wherein the verifying includes determining a relative permittivity of the substrate in a division position of a variation range of the relative permittivity of the substrate such that a variation range of a propagation delay time of the signal waveform corresponding to the variation range of the relative permittivity of the substrate is divided at even intervals; generating an analysis model corresponding to the relative permittivity of the substrate in the determined division position; and performing waveform analysis on the signal waveform using the generated analysis model.


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