The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Mar. 15, 2013
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Caleb Welton, Foster City, CA (US);

Hitoshi Harada, Foster City, CA (US);

Jeffrey Cohen, Sunnyvale, CA (US);

Lei Chang, Beijing, CN;

Radhika Reddy, Cupertino, CA (US);

Tao Ma, Beijing, CN;

Zhanwei Wang, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30463 (2013.01);
Abstract

A method and system for executing a query in parallel is disclosed. A master node may receive a query from a client and develop query plans from that query. The query plans may be forwarded to worker nodes for execution, and each query plan may be accompanied by query metadata. The metadata may be stored in a catalog on the master node.


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