The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Jun. 16, 2017
Fluke Corporation, Everett, WA (US);
Luis R. Silva, Lynnwood, WA (US);
Michael D. Stuart, Issaquah, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
Systems and methods detect abnormal conditions in electrical circuits by providing thermal imaging combined with non-contact measurements of current and voltage. Such systems may be implemented in a single test device, or in wired combinations, or in wireless communication implementations with multiple test devices and/or accessories, or in combination with one or more additional devices, such as a mobile phone, tablet, personal computer (PC), cloud-based server, etc. A thermal imaging tool that includes an infrared sensor may first discover and image one or more thermal anomalies in an object, such as an electrical circuit. One or more non-contact current or voltage sensors may be used to measure current and/or voltage, which allows for determination of the power loss at the measured location. The power loss may be used to determine an estimation of the abnormal resistive power losses in a circuit, as well as the costs associated therewith.