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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10120011 B1

PDFFull Text
Date of Patent:
Nov. 06, 2018

Filed:

Feb. 12, 2015

Test unit

Applicant:

Nhk Spring Co., Ltd., Yokohama-shi, JP;

Inventors:

Kohei Hironaka, Nagano, JP;

Takashi Nidaira, Nagano, JP;

Tomohiro Yoneda, Nagano, JP;

Assignee:

NHK Spring Co., Ltd., Yokohama-shi, JP;

Attorney:

Locke Lord LLP

Primary Examiner:

Jermele M Hollington

Assistant Examiner:

Suresh K Rajaputra

Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 1/073 (2006.01); H01R 13/24 (2006.01); G01R 31/28 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 31/026 (2013.01); G01R 1/073 (2013.01); G01R 31/26 (2013.01); G01R 31/2886 (2013.01); G01R 31/2896 (2013.01); H01R 13/2435 (2013.01);
Abstract

A test unit according to the present invention includes: a first contact probe contacting with an electrode provided on a front surface of one of contact targets, and contacting with an electrode of the other contact target; a second contact probe contacting with an electrode provided on a back surface of the one of contact targets and contacting with an electrode of a substrate; a first probe holder including a suction holder that sucks and holds the one of contact targets, and accommodating and holding therein the first contact probes; a second probe holder accommodating and holding therein the second contact probes; and a base portion, which is layered over the first probe holder and holds the other contact target at a side thereof layered over the first probe holder; and a gap is formed between the other contact target and the first probe holder.

Find Patent Forward Citations

Hironaka, Kohei. (2018). Test unit (U.S. Patent No. 10120011). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10120011

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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