The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Oct. 29, 2010
Applicants:
Peter Lea, Toronto, CA;
Jennifer Hansen, Toronto, CA;
Kate Smith, Toronto, CA;
Inventors:
Assignee:
SQI DIAGNOSTICS SYSTEMS INC., Toronto, ON, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
G01N 33/6845 (2013.01); G01N 2440/18 (2013.01); G01N 2800/101 (2013.01); G01N 2800/52 (2013.01);
Abstract
The present invention relates to multiplex microarrays and methods for the quantification of analytes. In particular, the invention relates to improved methods which standardize a target analyte concentration in a test sample against a reference standardization curve derived from validated, approved and recognized reference standards for the target analyte of known concentrations. The present invention also relates to methods and checks for simultaneous measurement of confidence confirming normalization standards and controls.